Selvamanickam V., Wosik J., Sun S., Sandra J.S., Paidpilli M., Yerraguravagari V., Suarez-Villagran M*2.
Ключевые слова: neural networks, microwave devices, HTS, YBCO, thin films, substrate single crystal, filter, modeling, design
Mancini A., Rufoloni A., Vannozzi A., Celentano G., Braccini V., Putti M., Rizzo F., Augieri A., Armenio A.A., Martinelli A., Sotgiu G., Meledin A., Pinto V., Piperno L., Manca N., Cialone M., Iebole M.
Ключевые слова: MgB2, substrate SiC, CVD process, fabrication, films epitaxial, thin films, microstructure, resistive transition, resistivity, temperature dependence
Hu J., Chen D., Zhang X., Hu Y., Li P., Tao J., Yang L., Pan M., Peng J., Zhang Q., Qiu W., Huang D., Ji M., Sun K.
Strbik V., Chromik S., Spankova M., Rosova A., Camerlingo C., Sojkova M., Talacko M., Bareli G., Jung G.
Ключевые слова: HTS, YBCO, thin films, films epitaxial, substrate single crystal, comparison, PLD process, irradiation effects, electron irradiation, defects, Raman spectroscopy, resistive transition, critical caracteristics, critical current, temperature dependence, oxygen, composition, electron diffraction, microstructure
Ключевые слова: chalcogenide, FeSeTe, coated conductors, PLD process, IBAD process, RABITS process, substrate Hastelloy, template layers, thin films, substrate single crystal, comparison, X-ray diffraction, lattice parameter, resistive transition, magnetization, temperature dependence, critical caracteristics, Jc/B curves, microstructure, fabrication, experimental results
Ключевые слова: YBCO, thin films, fabrication, spin coating process, substrate Si, Raman spectroscopy
Ключевые слова: HTS, YBCO, thin films, new, fabrication, electron beam evaporation, pulsed operation, targets, density, microstructure, substrate Si, experimental results
Lang W., Pedarnig J.D., Dosmailov M., Koelle D., Kleiner R., Mletschnig K.L., Aichner B., Muller B., Karrer M.
Ключевые слова: HTS, YBCO, thin films, PLD process, substrate single crystal, films epitaxial, irradiation effects, ion irradiation, vortex structures, pinning centers artificial, defects columnar, flux flow resistance, magnetic field dependence, angular dependence, experimental results, temperature distribution
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